Material	Emissivity
	1.0µm	1.6µm	8-14µm
Aluminum
Unoxidized	0.1-0.2	0.02-0.2	n.r.
Oxidized	0.4	0.4	0.2-0.4
Alloy A3003
Oxidized	n.r.	0.4	0.3
Roughened	0.2-0.8	0.2-0.6	0.1-0.3
Polished	0.1-0.2	0.02-0.1	n.r.
Brass
Polished	0.8-0.95	0.01-0.05	n.r.
Burnished	n.r.	n.r.	0.3
Oxidized	0.6	0.6	0.5
Chromium	0.4	0.4	n.r.
Copper
Polished	n.r.	0.03	n.r.
Roughened	n.r.	0.05-0.2	n.r.
Oxidized	0.2-0.8	0.2-0.9	0.4-0.8
Electrical Terminal Blocks	n.r.	n.r.	0.6
Gold	0.3	0.01-0.1	n.r.
Haynes
Alloy	0.5-0.9	0.6-0.9	0.3-0.8
Inconel
Oxidized	0.4-0.9	0.6-0.9	0.7-.95
Sandblasted	0.3-0.4	0.3-0.6	0.3-0.6
Electoropolished	0.2-0.5	0.25	0.15
Iron
Oxidized	0.4-0.8	0.5-0.9	0.5-0.9
Unoxidized	0.35	0.1-0.3	n.r.
Rusted	n.r.	0.6-0.9	0.5-0.7
Molten	0.35	0.4-0.6	n.r.
Iron, Cast
Oxidized	0.7-0.9	0.7-0.9	0.6-0.95
Unoxidized	0.35	0.3	0.2
Molten	.035	0.3-0.4	0.2-0.3
Iron, Wrought
Dull	0.9	0.9	0.9
Lead
Polished	0.35	0.05-0.2	n.r.
Rough	0.65	0.6	0.4
Oxidized	n.r.	0.3-0.7	0.2-0.6
Magnesium	0.3-0.8	0.05-0.3	n.r.
Mercury	n.r.	0.05-0.15	n.r.
Molybdenum
Oxidized	0.5-0.9	0.4-0.9	0.2-0.6
Unoxidized	0.25-0.35	0.1-0.35
Nickel
Oxidized	0.8-0.9	0.4-0.7	0.2-0.5
Electrolytic	0.2-0.04	0.1-0.3	n.r.
Platinum
Black	n.r.	0.95	0.9
Silver	n.r.	0.02	.n.r
Steel
Cold-Rolled	0.8-0.9	0.8-0.9	0.7-0.9
ground Sheet	n.r.	n.r.	0.4-0.6
Polished Sheet	0.35	0.25	0.1
Molten	0.35	0.25-0.4	n.r.
Oxidized	0.8-0.9	0.8-0.9	0.7-0.9
Stainless	0.35	0.2-0.9	0.1-0.8
Tin(Unoxidized)	0.25	0.1-0.3	n.r.
Titanium
Polished	0.5-0.75	0.3-0.5	n.r.
Oxidized	n.r.	0.6-0.8	0.5-0.6
Tungsten	n.r.	0.1-0.6	n.r.
Polished	0.35-0.4	0.1-0.3	n.r.
Zinc
Oxidized	0.6	0.15	0.1
Polished	0.5	0.05	n.r.

n.r.=not recommended

To optimize surface temperature measurement accuracy:
1. Determine the object emissivity for the spectral range of the instrument to
be used for the measurement.
2. Avoid reflections by shielding object from surrounding high temperature sources.
3. For higher temperature objects use shorter wavelength instruments, whenever possible.
4. For semi-transparent materials such as plastic film and glass, assure that
the background is uniform and lower in temperature than the object.
5. Hold instrument perpendicular to surface whenever emissivity is less than 0.9.
In all cases, do not exceed angles more than 30 degrees from incidence.
6. For 1M and 2M models, avoid measurements in high ambient light conditions.
7. For Raytek MT, ST, or MX, use the 8-14 micron column.

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